Incoherent twin boundary migration induced by ion irradiation in Cu Academic Article uri icon

abstract

  • Grain boundaries can act as sinks for radiation-induced point defects. The sink capability is dependent on the atomic structures and varies with the type of point defects. Using high-resolution transmission electron microscopy, we observed that 3{112} incoherent twin boundary (ITB) in Cu films migrates under Cu3+ ion irradiation. Using atomistic modeling, we found that 3{112} ITB has the preferred sites for adsorbing interstitials and the preferential diffusion channels along the Shockley partial dislocations. Coupling with the high mobility of grain boundary Shockley dislocations within 3{112} ITB, we infer that 3{112} ITB migrates through the collective glide of grain boundary Shockley dislocations, driven by a concurrent reduction in the density of radiation-induced defects, which is demonstrated by the distribution of nearby radiation-induced defects.

published proceedings

  • Journal of Applied Physics

author list (cited authors)

  • Li, N., Wang, J., Wang, Y. Q., Serruys, Y., Nastasi, M., & Misra, A.

citation count

  • 63

publication date

  • January 2013