Component-Level Reliability Evaluation Model for Cyber Power Devices Academic Article

authors

• Singh, Chanan

published proceedings

• IEEE TRANSACTIONS ON SMART GRID

author list (cited authors)

• Balachandran, T., Manoharan, A., Aravinthan, V., & Singh, C.

citation count

• 6

complete list of authors

• Balachandran, Thanatheepan||Manoharan, Arun-Kaarthick||Aravinthan, Visvakumar||Singh, Chanan

publication date

• January 2021

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

keywords

• Analytical Models
• Automation
• Component Reliability
• Computational Modeling
• Cyber Failure
• Cyber Power Network
• Cyberattack
• Multistate Model
• Power System Automation Component
• Power System Reliability
• Reliability

Digital Object Identifier (DOI)

• 10.1109/TSG.2020.3016524

start page

• 692

end page

• 703

volume

• 12

issue

• 1

URL

• http://dx.doi.org/10.1109/tsg.2020.3016524

user-defined tag

• 7 Affordable and Clean Energy