Scanning Electron Microscopy Measurements of the Luminescent and Electrical Properties of Thin Film Photovoltaic Devices Conference Paper uri icon

abstract

  • Thin film photovoltaic (PV) devices with CdTe, CIGS, and Perovskite absorber layers have achieved high power conversion efficiencies and, in the case of CdTe, commercial success. Continued development of these technologies is needed to continue recent trends toward lower cost and increased utilization of solar energy. Luminescent and electrical characterization during scanning electron microscopy (SEM) can provide valuable insight to potential improvements in the fabrication of these photovoltaics (PVs). We have explored the use of SEM to study these thin film PVs using cathodoluminescence (CL), electron beam induced current (EBIC), and energy-dispersive X-ray spectroscopy (EDS). Here we report on the results of both the individual measurements and correlations between the properties. Changes in the PV film due to electron beam exposure are also discussed. These measurements were then used to modify fabrication procedures.

author list (cited authors)

  • Harvey, T. B., & Torabi, A.

publication date

  • January 1, 2019 11:11 AM