Chip level power supply partitioning for I-DDQ testing using built-in current sensors Conference Paper uri icon

name of conference

  • Proceedings. 16th IEEE Symposium on Computer Arithmetic

published proceedings

  • 18TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS

author list (cited authors)

  • Prasad, A., & Walker, D.

citation count

  • 3

complete list of authors

  • Prasad, A||Walker, DMH

publication date

  • January 2003