Chip level power supply partitioning for I-DDQ testing using built-in current sensors Conference Paper

name of conference

• Proceedings. 16th IEEE Symposium on Computer Arithmetic

authors

• Walker, Duncan

published proceedings

• 18TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS

author list (cited authors)

• Prasad, A., & Walker, D.

citation count

• 3

complete list of authors

• Prasad, A||Walker, DMH

publication date

• January 2003

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems  Journal

keywords

• 40 Engineering
• 4008 Electrical Engineering
• 4009 Electronics, Sensors And Digital Hardware

Digital Object Identifier (DOI)

• 10.1109/DFTVS.2003.1250105

International Standard Book Number (ISBN) 10

• 0-7695-2042-1

start page

• 140

end page

• 147

URL

• http://dx.doi.org/10.1109/dftvs.2003.1250105