Observability Driven Path Generation for Delay Test Coverage Improvement in Scan Limited Circuits Conference Paper

name of conference

• 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

authors

• Walker, Duncan

published proceedings

• 2020 33RD IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT)

author list (cited authors)

• Chakraborty, A., & Walker, D.

citation count

• 0

complete list of authors

• Chakraborty, Avijit||Walker, DMH

publication date

• October 2020

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems  Journal

keywords

• Coverage
• Delay Test
• Observability
• Scan Test

Digital Object Identifier (DOI)

• 10.1109/dft50435.2020.9250797

start page

• 1

end page

• 4

volume

• 00

URL

• http://dx.doi.org/10.1109/dft50435.2020.9250797