Observability Driven Path Generation for Delay Test Coverage Improvement in Scan Limited Circuits Conference Paper uri icon

name of conference

  • 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

published proceedings

  • 2020 33RD IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT)

author list (cited authors)

  • Chakraborty, A., & Walker, D.

citation count

  • 0

complete list of authors

  • Chakraborty, Avijit||Walker, DMH

publication date

  • January 1, 2020 11:11 AM