A statistical fault coverage metric for realistic path delay faults Conference Paper uri icon

name of conference

  • 22nd IEEE VLSI Test Symposium, 2004.

published proceedings

  • 22nd IEEE VLSI Test Symposium, 2004. Proceedings.

author list (cited authors)

  • Wangqi Qiu, .., Xiang Lu, .., Jing Wang, .., Zhuo Li, .., Walker, D., & Weiping Shi.

citation count

  • 16

complete list of authors

  • Walker, DMH

publication date

  • January 2004

publisher