A Statistical Fault Coverage Metric for Realistic Path Delay Faults Conference Paper

name of conference

• 22nd IEEE VLSI Test Symposium, 2004. Proceedings.

authors

• Walker, Duncan

published proceedings

• 22nd IEEE VLSI Test Symposium, 2004. Proceedings.

author list (cited authors)

• Qiu, W., Wang, J., Walker, D., Lu, X., Li, Z., & Shi, W.

citation count

• 16

complete list of authors

• Qiu, Wangqi||Wang, Jing||Walker, DMH||Lu, Xiang||Li, Zhuo||Shi, Weiping

publication date

• January 2004

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

Digital Object Identifier (DOI)

• 10.1109/vtest.2004.1299223

start page

• 1

end page

• 6

URL

• http://dx.doi.org/10.1109/vtest.2004.1299223