Wavelet estimation of a base-line signal from repeated noisy measurements by vertical block shrinkage
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COMPUTATIONAL STATISTICS & DATA ANALYSIS
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Chang, W., & Vidakovic, B.
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Empirical Bayes Method
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Stein-type Estimators
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Wavelet Shrinkage
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http://dx.doi.org/10.1016/s0167-9473(02)00053-1