Comparison of the spatial variation in the barrier height of Si and GaAs Schottky diodes as measured by ballistic electron emission microscopy Chapter uri icon

author list (cited authors)

  • Kavanag, K. L., Talin, A. A., Morgan, B. A., Williams, R. S., & Ring, K.

citation count

  • 0

Book Title

  • Control of Semiconductor Interfaces

publication date

  • January 1994