Comparison of the spatial variation in the barrier height of Si and GaAs Schottky diodes as measured by ballistic electron emission microscopy
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author list (cited authors)
Kavanag, K. L., Talin, A. A., Morgan, B. A., Williams, R. S., & Ring, K.
complete list of authors
Kavanag, Karen L||Talin, A Alec||Morgan, Brent A||Williams, R Stanley||Ring, Ken
Control of Semiconductor Interfaces