Engineering Of Memristors For Crossbar Devices Using The Helium Ion Microscope Academic Article

abstract

• Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 August 2, 2012.

authors

• Williams, R. Stanley

published proceedings

• Microscopy and Microanalysis

author list (cited authors)

• Winston, D., Ohlberg, D., Strachan, J., & Williams, R. S.

citation count

• 0

complete list of authors

• Winston, D||Ohlberg, D||Strachan, J||Williams, RS

publication date

• January 2012

publisher

• Oxford University Press (OUP)  Publisher

published in

• Microscopy and Microanalysis  Journal

Digital Object Identifier (DOI)

• 10.1017/s1431927612005946

start page

• 818

end page

• 819

volume

• 18

issue

• S2

URL

• http://dx.doi.org/10.1017/s1431927612005946