Electron Energy-Loss Spectroscopy (EELS) Study of NbOx Film for Resistive Memory Applications Academic Article uri icon

published proceedings

  • Microscopy and Microanalysis

author list (cited authors)

  • Zhang, J., Norris, K., Samuels, K., Ge, N., Zhang, M., Park, J., ... Williams, R. S.

citation count

  • 3

complete list of authors

  • Zhang, Jiaming||Norris, Kate||Samuels, Katy||Ge, Ning||Zhang, Max||Park, Joonsuk||Sinclair, Robert||Gibson, Gary||Yang, J Joshua||Li, Zhiyong||Williams, R Stanley

publication date

  • August 2015