Electron Energy-Loss Spectroscopy (EELS) Study of NbOx Film for Resistive Memory Applications Academic Article

authors

• Williams, R. Stanley

published proceedings

• Microscopy and Microanalysis

author list (cited authors)

• Zhang, J., Norris, K., Samuels, K., Ge, N., Zhang, M., Park, J., ... Williams, R. S.

citation count

• 3

complete list of authors

• Zhang, Jiaming||Norris, Kate||Samuels, Katy||Ge, Ning||Zhang, Max||Park, Joonsuk||Sinclair, Robert||Gibson, Gary||Yang, J Joshua||Li, Zhiyong||Williams, R Stanley

publication date

• January 2015

publisher

• Oxford University Press (OUP)  Publisher

published in

• Microscopy and Microanalysis  Journal

Digital Object Identifier (DOI)

• 10.1017/s1431927615002226

start page

• 285

end page

• 286

volume

• 21

issue

• S3

URL

• http://dx.doi.org/10.1017/s1431927615002226