Electron Tomography Study on Nanoscale HfOx/AlOy-based Resistive Switching Device Academic Article

Overview
Identity
Additional Document Info
Other
View All

authors

Williams, R. Stanley

published proceedings

Microscopy and Microanalysis

author list (cited authors)

Zhang, J., Ercius, P., Zhang, P., Luo, J., Kim, K., Zhang, M., & Williams, R. S.

citation count

0

complete list of authors

Zhang, Jiaming||Ercius, Peter||Zhang, Peng||Luo, Jie||Kim, Kyungmin||Zhang, Max||Williams, R Stanley

publication date

January 2017

publisher

Oxford University Press (OUP) Publisher

published in

Microscopy and Microanalysis Journal