Electron Tomography Study on Nanoscale HfOx/AlOy-based Resistive Switching Device Academic Article uri icon

published proceedings

  • Microscopy and Microanalysis

author list (cited authors)

  • Zhang, J., Ercius, P., Zhang, P., Luo, J., Kim, K., Zhang, M., & Williams, R. S.

citation count

  • 0

complete list of authors

  • Zhang, Jiaming||Ercius, Peter||Zhang, Peng||Luo, Jie||Kim, Kyungmin||Zhang, Max||Williams, R Stanley

publication date

  • July 2017