Spectromicroscopy of tantalum oxide memristors Academic Article uri icon

abstract

  • We report experiments to measure material changes in tantalum oxide-based memristive devices. The high endurance and low power demonstrated in this material system suggests a unique mechanism for the switching, which we investigated using x-ray based spectromicroscopy and nanospectroscopy. Our study nondestructively identified a localized (>150nm diameter) Ta-rich phase surrounded by nano- or polycrystalline Ta2O5.

published proceedings

  • APPLIED PHYSICS LETTERS

author list (cited authors)

  • Strachan, J. P., Medeiros-Ribeiro, G., Yang, J. J., Zhang, M., Miao, F., Goldfarb, I., ... Williams, R. S.

citation count

  • 86

complete list of authors

  • Strachan, John Paul||Medeiros-Ribeiro, Gilberto||Yang, J Joshua||Zhang, M-X||Miao, Feng||Goldfarb, Ilan||Holt, Martin||Rose, Volker||Williams, R Stanley

publication date

  • June 2011