Structural and chemical characterization of TiO2 memristive devices by spatially-resolved NEXAFS
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We used spatially-resolved NEXAFS (near-edge x-ray absorption fine structure) spectroscopy coupled with microscopy to characterize the electronic, structural and chemical properties of bipolar resistive switching devices. Metal/TiO2/metal devices were electroformed with both bias polarities and then physically opened to study the resulting material changes within the device. Soft x-ray absorption techniques allowed isolated study of the different materials present in the device with 100 nm spatial resolution. The resulting morphology and structural changes reveal a picture of localized polarity-independent heating occurring within these devices initiated by and subsequently accelerating polarity-dependent electrochemical reduction/oxidation processes.
author list (cited authors)
Strachan, J. P., Yang, J. J., Münstermann, R., Scholl, A., Medeiros-Ribeiro, G., Stewart, D. R., & Williams, R. S.