Structural and chemical characterization of TiO2 memristive devices by spatially-resolved NEXAFS. Academic Article uri icon

abstract

  • We used spatially-resolved NEXAFS (near-edge x-ray absorption fine structure) spectroscopy coupled with microscopy to characterize the electronic, structural and chemical properties of bipolar resistive switching devices. Metal/TiO2/metal devices were electroformed with both bias polarities and then physically opened to study the resulting material changes within the device. Soft x-ray absorption techniques allowed isolated study of the different materials present in the device with 100 nm spatial resolution. The resulting morphology and structural changes reveal a picture of localized polarity-independent heating occurring within these devices initiated by and subsequently accelerating polarity-dependent electrochemical reduction/oxidation processes.

published proceedings

  • Nanotechnology

author list (cited authors)

  • Strachan, J. P., Joshua Yang, J., M√ľnstermann, R., Scholl, A., Medeiros-Ribeiro, G., Stewart, D. R., & Stanley Williams, R.

citation count

  • 61

complete list of authors

  • Strachan, John Paul||Joshua Yang, J||M√ľnstermann, Ruth||Scholl, Andreas||Medeiros-Ribeiro, Gilberto||Stewart, Duncan R||Stanley Williams, R

publication date

  • December 2009