Smooth Ag film deposited using e-beam evaporated Ge as an intermediate layer for applications in nanoscale devices and optical superlens Conference Paper uri icon

published proceedings

  • MATERIALS, PROCESSES, INTEGRATION AND RELIABILITY IN ADVANCED INTERCONNECTS FOR MICRO- AND NANOELECTRONICS

author list (cited authors)

  • Vj, L., Kobayashi, N. P., Wu, W., Islam, M. S., Fang, N. X., Wang, S. Y., & Williams, R. S.

complete list of authors

  • Vj, Logeeswaran||Kobayashi, Nobuhiko P||Wu, Wei||Islam, M Saif||Fang, Nicholas Xuanlai||Wang, Shih Yuan||Williams, R Stanley

publication date

  • January 1, 2007 11:11 AM