Radiation Hardness of ${
m TiO}_{2}$ Memristive Junctions Academic Article uri icon

published proceedings

  • IEEE Transactions on Nuclear Science

altmetric score

  • 0.85

author list (cited authors)

  • Tong, W. M., Yang, J. J., Kuekes, P. J., Stewart, D. R., Williams, R. S., DeIonno, E., ... Osborn, J. V.

citation count

  • 59

complete list of authors

  • Tong, William M||Yang, J Joshua||Kuekes, Philip J||Stewart, Duncan R||Williams, R Stanley||DeIonno, Erica||King, Everett E||Witczak, Steven C||Looper, Mark D||Osborn, Jon V

publication date

  • June 2010