Atomic Force Microscope Studies of Fullerene Films: Highly Stable C60 fcc (311) Free Surfaces Academic Article uri icon

abstract

  • Atomic force microscopy and x-ray diffractometry were used to study 1500 A-thick films of pure C(60) grown by sublimation in ultrahigh vacuum onto a CaF(2) (111) substrate. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond to a face-centered cubic (311) surface and distortions of this surface. The open (311) structure may have a relatively low free energy because the low packing density contributes to a high entropy of the exposed surface.

altmetric score

  • 6

author list (cited authors)

  • SNYDER, E. J., ANDERSON, M. S., TONG, W. M., WILLIAMS, R. S., ANZ, S. J., ALVAREZ, M. M., ... WHETTEN, R. L.

citation count

  • 61

publication date

  • July 1991