ANYL 90-Characterization of soft-landed vapor deposited top metal contact on self-assembled monolayers for molecular junction electronic devices Conference Paper uri icon

published proceedings

  • ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY

author list (cited authors)

  • Maitani, M., Ohlberg, D., Li, Z., Allara, D. L., Stewart, D. R., & Williams, R. S.

complete list of authors

  • Maitani, Masato||Ohlberg, Douglas AA||Li, Zhiyong||Allara, David L||Stewart, Duncan R||Williams, R Stanley

publication date

  • August 2008