Oxygen migration during resistance switching and failure of hafnium oxide memristors Academic Article uri icon

published proceedings

  • Applied Physics Letters

altmetric score

  • 2.25

author list (cited authors)

  • Kumar, S., Wang, Z., Huang, X., Kumari, N., Davila, N., Strachan, J. P., ... Williams, R. S.

citation count

  • 50

complete list of authors

  • Kumar, Suhas||Wang, Ziwen||Huang, Xiaopeng||Kumari, Niru||Davila, Noraica||Strachan, John Paul||Vine, David||Kilcoyne, AL David||Nishi, Yoshio||Williams, R Stanley

publication date

  • March 2017