Comparison of au contacts to Si, GaAs, InxGa1-xP, and ZnSe measured by ballistic electron emission microscopy Academic Article uri icon

published proceedings

  • MATERIALS CHEMISTRY AND PHYSICS

author list (cited authors)

  • Morgan, B. A., Talin, A. A., Bi, W. G., Kavanagh, K. L., Williams, R. S., Tu, C. W., ... Segawa, Y.

citation count

  • 8

publication date

  • November 1996