Comparison of au contacts to Si, GaAs, InxGa1-xP, and ZnSe measured by ballistic electron emission microscopy
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MATERIALS CHEMISTRY AND PHYSICS
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Morgan, B. A., Talin, A. A., Bi, W. G., Kavanagh, K. L., Williams, R. S., Tu, C. W., ... Segawa, Y.
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Ballistic Electron Emission Microscopy
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Electronic Properties
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Gold Contacts
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http://dx.doi.org/10.1016/s0254-0584(97)80017-x