Time dependent ballistic electron emission microscopy studies of a Au/(100)GaAs interface with a native oxide diffusion barrier
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Talin, A. A., Ohlberg, D., Williams, R. S., Sullivan, P., Koutselas, I., Williams, B., & Kavanagh, K. L.
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Talin, A Alec||Ohlberg, Douglas AA||Williams, R Stanley||Sullivan, Patrick||Koutselas, Ioannis||Williams, Beth||Kavanagh, Karen L
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