Role of interface microstructure in rectifying metal/semiconductor contacts: Ballistic electron emission observations correlated to microstructure
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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
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Morgan, B. A., Ring, K. M., Kavanagh, K. L., Talin, A. A., Williams, R. S., Yasuda, T., Yasui, T., & Segawa, Y.
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Morgan, BA||Ring, KM||Kavanagh, KL||Talin, AA||Williams, RS||Yasuda, T||Yasui, T||Segawa, Y
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http://dx.doi.org/10.1116/1.588523