Electrode-material dependent switching in TaOx memristors
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- Overview
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- Research
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- Identity
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Overview
published proceedings
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SEMICONDUCTOR SCIENCE AND TECHNOLOGY
author list (cited authors)
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Ge, N., Zhang, M., Zhang, L. u., Yang, J. J., Li, Z., & Williams, R. S.
citation count
complete list of authors
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Ge, Ning||Zhang, M-X||Zhang, Lu||Yang, J Joshua||Li, Zhiyong||Williams, R Stanley
publication date
publisher
Research
keywords
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Electrode-material
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Memristive
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Nvram
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Resistance Switching
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Rram
Identity
Digital Object Identifier (DOI)
Additional Document Info
start page
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volume
issue
Other
URL
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http://dx.doi.org/10.1088/0268-1242/29/10/104003