Defect-tolerant interconnect to nanoelectronic circuits: internally redundant demultiplexers based on error-correcting codes Academic Article uri icon

published proceedings

  • Nanotechnology

altmetric score

  • 3

author list (cited authors)

  • Kuekes, P. J., Robinett, W., Seroussi, G., & Williams, R. S.

citation count

  • 52

complete list of authors

  • Kuekes, Philip J||Robinett, Warren||Seroussi, Gadiel||Williams, R Stanley

publication date

  • April 2005