Defect-tolerant interconnect to nanoelectronic circuits: internally redundant demultiplexers based on error-correcting codes Academic Article

authors

• Williams, R. Stanley

published proceedings

• NANOTECHNOLOGY

altmetric score

• 3

author list (cited authors)

• Kuekes, P. J., Robinett, W., Seroussi, G., & Williams, R. S.

citation count

• 52

complete list of authors

• Kuekes, PJ||Robinett, W||Seroussi, G||Williams, RS

publication date

• June 2005

publisher

• IOP Publishing  Publisher

keywords

• 40 Engineering
• 4008 Electrical Engineering

Digital Object Identifier (DOI)

• 10.1088/0957-4484/16/6/043

start page

• 869

end page

• 882

volume

• 16

issue

• 6

URL

• http://dx.doi.org/10.1088/0957-4484/16/6/043