INTERFACE ROUGHNESS - WHAT IS IT AND HOW IS IT MEASURED Conference Paper

authors

• Williams, R. Stanley

published proceedings

• EVOLUTION OF SURFACE AND THIN FILM MICROSTRUCTURE

author list (cited authors)

• CHASON, E., FALCO, C. M., OURMAZD, A., SCHUBERT, E. F., SLAUGHTER, J. M., & WILLIAMS, R. S.

complete list of authors

• CHASON, E||FALCO, CM||OURMAZD, A||SCHUBERT, EF||SLAUGHTER, JM||WILLIAMS, RS

publication date

• January 1993

published in

• MRS Online Proceedings Library  Journal

International Standard Book Number (ISBN) 10

• 1-558-99175-1

start page

• 203

end page

• 239

volume

• 280