INTERFACE ROUGHNESS - WHAT IS IT AND HOW IS IT MEASURED Conference Paper uri icon

published proceedings

  • EVOLUTION OF SURFACE AND THIN FILM MICROSTRUCTURE

author list (cited authors)

  • CHASON, E., FALCO, C. M., OURMAZD, A., SCHUBERT, E. F., SLAUGHTER, J. M., & WILLIAMS, R. S.

complete list of authors

  • CHASON, E||FALCO, CM||OURMAZD, A||SCHUBERT, EF||SLAUGHTER, JM||WILLIAMS, RS

publication date

  • January 1, 1993 11:11 AM