Issues concerning the preparation of ohmic contacts to n-GaN Academic Article

authors

• Williams, R. Stanley

published proceedings

• SOLID-STATE ELECTRONICS

altmetric score

• 3

author list (cited authors)

• Pelto, C. M., Chang, Y. A., Chen, Y., & Williams, R. S.

citation count

• 16

publication date

• September 2001

publisher

• Elsevier  Publisher

keywords

• Aluminum
• Annealing
• Electrical Characteristics
• Gan
• Nial
• Ohmic Contacts
• Oxidation
• Processing
• Titanium
• Transmission Line Models

Digital Object Identifier (DOI)

• 10.1016/S0038-1101(01)00163-0

start page

• 1597

end page

• 1605

volume

• 45

issue

• 9

URL

• http://dx.doi.org/10.1016/s0038-1101(01)00163-0