SURFACE-STRUCTURE OF EPITAXIAL NISI2 GROWN ON SI(001) DETERMINED BY LOW-ENERGY ION-SCATTERING TECHNIQUES
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HUANG, J. H., DALEY, R. S., SHUH, D. K., & WILLIAMS, R. S.
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34 Chemical Sciences
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3406 Physical Chemistry
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51 Physical Sciences
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http://dx.doi.org/10.1016/s0039-6028(87)80038-9