Effect of Conductance Variability on Resistor-Logic Demultiplexers for Nanoelectronics Academic Article uri icon

published proceedings

  • IEEE Transactions on Nanotechnology

altmetric score

  • 6

author list (cited authors)

  • Kuekes, P. J., Robinett, W., & Williams, R. S.

citation count

  • 7

complete list of authors

  • Kuekes, PJ||Robinett, W||Williams, RS

publication date

  • September 2006