Effect of conductance variability on resistor-logic demultiplexers for nanoelectronics Academic Article

authors

• Williams, R. Stanley

published proceedings

• IEEE TRANSACTIONS ON NANOTECHNOLOGY

altmetric score

• 6

author list (cited authors)

• Kuekes, P. J., Robinett, W., & Williams, R. S.

citation count

• 7

publication date

• September 2006

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

keywords

• Demultiplexing
• Error Correction Coding
• Nanotechnology
• Resistive Circuits
• Voltage Dividers

Digital Object Identifier (DOI)

• 10.1109/TNANO.2006.880405

start page

• 446

end page

• 454

volume

• 5

issue

• 5

URL

• http://dx.doi.org/10.1109/tnano.2006.880405