Improved voltage margins using linear error-correcting codes in resistor-logic demultiplexers for nanoelectronics Academic Article

authors

• Williams, R. Stanley

published proceedings

• NANOTECHNOLOGY

author list (cited authors)

• Kuekes, P. J., Robinett, W., & Williams, R. S.

citation count

• 24

complete list of authors

• Kuekes, PJ||Robinett, W||Williams, RS

publication date

• September 2005

publisher

• IOP Publishing  Publisher

published in

• Nanotechnology  Journal

keywords

• 40 Engineering
• 4008 Electrical Engineering
• 4009 Electronics, Sensors And Digital Hardware

Digital Object Identifier (DOI)

• 10.1088/0957-4484/16/9/001

start page

• 1419

end page

• 1432

volume

• 16

issue

• 9

URL

• http://dx.doi.org/10.1088/0957-4484/16/9/001