ANALYSIS OF SCANNING TUNNELING MICROSCOPE TOPOGRAPHS OF GRAPHITE SURFACES ROUGHENED BY AR+ ION-BOMBARDMENT Conference Paper

abstract

• ABSTRACTThe scanning tunneling microscope (STM) has been used to investigate graphite surfaces roughened by 5 keV Ar+ ion bombardment. The (0001) surfaces of several samples were etched with the same total ion dose but with different sputter rates for each surface. STM images taken after sputtering show that the roughness of the sputtered surfaces depended on the sputter rate and that the surface topography of each sample appeared self-similar over a large range of length scales. These experimental observations agree with predictions of the recently proposed Shadow Model. The two dimensional height-height correlation function is utilized as a means of quantitative analysis for STM topographs of sputtered surfaces.

authors

• Williams, R. Stanley

published proceedings

• BEAM-SOLID INTERACTIONS : PHYSICAL PHENOMENA

author list (cited authors)

• EKLUND, E. A., WILLIAMS, R. S., & SNYDER, E. J.

citation count

• 1

complete list of authors

• EKLUND, EA||WILLIAMS, RS||SNYDER, EJ

publication date

• 1990

publisher

• Springer Nature  Publisher

published in

• MRS Advances  Journal

keywords

• 34 Chemical Sciences
• 3403 Macromolecular And Materials Chemistry
• 40 Engineering
• 4016 Materials Engineering
• 4018 Nanotechnology

Digital Object Identifier (DOI)

• 10.1557/proc-157-305

International Standard Book Number (ISBN) 10

• 1-55899-045-3

start page

• 305

end page

• 310

volume

• 157

URL

• http://dx.doi.org/10.1557/proc-157-305