Atomic force microscope study of growth kinetics: Scaling in the heteroepitaxy of CuCl on CaF2(111).
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Tong, W. M., Williams, R. S., Yanase, A., Segawa, Y., & Anderson, M. S.
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Tong, WM||Williams, RS||Yanase, A||Segawa, Y||Anderson, MS
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40 Engineering
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4018 Nanotechnology
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51 Physical Sciences
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http://dx.doi.org/10.1103/physrevlett.72.3374