Lognormal switching times for titanium dioxide bipolar memristors: origin and resolution. Academic Article

abstract

• We measured the switching time statistics for a TiO(2) memristor and found that they followed a lognormal distribution, which is a potentially serious problem for computer memory and data storage applications. We examined the underlying physical phenomena that determine the switching statistics and proposed a simple analytical model for the distribution based on the drift/diffusion equation and previously measured nonlinear drift behavior. We designed a closed-loop switching protocol that dramatically narrows the time distribution, which can significantly improve memory circuit performance and reliability.

authors

• Williams, R. Stanley

published proceedings

• Nanotechnology

author list (cited authors)

• Medeiros-Ribeiro, G., Perner, F., Carter, R., Abdalla, H., Pickett, M. D., & Williams, R. S.

citation count

• 72

complete list of authors

• Medeiros-Ribeiro, Gilberto||Perner, Frederick||Carter, Richard||Abdalla, Hisham||Pickett, Matthew D||Williams, R Stanley

publication date

• March 2011

publisher

• IOP Publishing  Publisher

published in

• Nanotechnology  Journal

keywords

• Computer Storage Devices
• Electric Impedance
• Equipment Design
• Equipment Failure Analysis
• Nanostructures
• Nanotechnology
• Particle Size
• Signal Processing, Computer-Assisted
• Titanium

PubMed Central ID

• 21258143

Digital Object Identifier (DOI)

• 10.1088/0957-4484/22/9/095702

start page

• 095702

end page

• 095702

volume

• 22

issue

• 9

URL

• http://dx.doi.org/10.1088/0957-4484/22/9/095702