CORRELATION FROM RANDOMNESS - QUANTITATIVE-ANALYSIS OF ION-ETCHED GRAPHITE SURFACES USING THE SCANNING TUNNELING MICROSCOPE
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EKLUND, E. A., SNYDER, E. J., & WILLIAMS, R. S.
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51 Physical Sciences
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5104 Condensed Matter Physics
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http://dx.doi.org/10.1016/0039-6028(93)90427-l