Computing with a trillion crummy components Academic Article uri icon


  • Attempting to build nanometer-scale circuits that are both defect- and fault-tolerant.

published proceedings

  • Communications of the ACM

author list (cited authors)

  • Robinett, W., Snider, G. S., Kuekes, P. J., & Williams, R. S.

citation count

  • 11

complete list of authors

  • Robinett, Warren||Snider, Gregory S||Kuekes, Philip J||Williams, R Stanley

publication date

  • September 2007