Defect tolerance based on coding and series replication in transistor-logic demultiplexer circuits
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Overview
published proceedings
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IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
author list (cited authors)
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Robinett, W., Kuekes, P. J., & Williams, R. S.
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Research
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Error Correction Codes
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Fault Tolerance
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Reliability
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Transistor Circuits
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URL
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http://dx.doi.org/10.1109/tcsi.2007.907865
