Dual-Beam Irradiation Stability of Amorphous Silicon Oxycarbide at 300C and 500C
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Su, Q., Greaves, G., Donnelly, S. E., Mizuguchi, S., Ishimaru, M., & Nastasi, M.
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40 Engineering
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4016 Materials Engineering
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http://dx.doi.org/10.1007/s11837-020-04332-z
