Defect charging and resonant levels in half-Heusler Nb1-xTixFeSb Academic Article

authors

• Ross, Joseph

published proceedings

• MATERIALS TODAY PHYSICS

altmetric score

• 0.25

author list (cited authors)

• Tian, Y., Vagizov, F. G., Ghassemi, N., Ren, W., Zhu, H., Wang, Z., Ren, Z., & Ross, J.

citation count

• 3

complete list of authors

• Tian, Yefan||Vagizov, Farit G||Ghassemi, Nader||Ren, Wuyang||Zhu, Hangtian||Wang, Zhiming||Ren, Zhifeng||Ross, Joseph H Jr

publication date

• January 2021

publisher

• Elsevier  Publisher

published in

• Materials Today Physics  Journal

keywords

• Charging Defect
• Half-heusler
• Mossbauer
• NMR
• Resonant State

Digital Object Identifier (DOI)

• 10.1016/j.mtphys.2020.100278

start page

• 100278

end page

• 100278

volume

• 16

URL

• http://dx.doi.org/10.1016/j.mtphys.2020.100278