Risk-based fault detection using Self-Organizing Map
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Overview
published proceedings
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RELIABILITY ENGINEERING & SYSTEM SAFETY
author list (cited authors)
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Yu, H., Khan, F., & Garaniya, V.
citation count
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Yu, Hongyang||Khan, Faisal||Garaniya, Vikram
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Research
keywords
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Bayesian Updating
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Probabilistic Analysis
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Risk Assessment
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Self-organizing Map
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Digital Object Identifier (DOI)
Additional Document Info
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URL
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http://dx.doi.org/10.1016/j.ress.2015.02.011