Dynamic process fault detection and diagnosis based on a combined approach of hidden Markov and Bayesian network model

authors

• Khan, Faisal

published proceedings

• CHEMICAL ENGINEERING SCIENCE

author list (cited authors)

• Don, M. G., & Khan, F.

citation count

• 67

complete list of authors

• Don, Mihiran Galagedarage||Khan, Faisal

publication date

• June 2019

publisher

• Elsevier  Publisher

published in

• Chemical Engineering Science (CES)  Journal

keywords

• Bayesian Network
• Hidden Markov Model
• Process Fault Detection
• Process Fault Diagnosis

Digital Object Identifier (DOI)

• 10.1016/j.ces.2019.01.060

start page

• 82

end page

• 96

volume

• 201

URL

• http://dx.doi.org/10.1016/j.ces.2019.01.060