High Frequency Characterization of High Temperature Superconducting Thin-Film Lines
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van Deventer, T. E., Katehi, P. B., Josefowicz, J. Y., & Rensch, D. B.
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van Deventer, TE||Katehi, PB||Josefowicz, JY||Rensch, DB
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http://dx.doi.org/10.1080/02726349108908277