Electro-optic field mapping system utilizing external gallium arsenide probes Academic Article uri icon

abstract

  • External electro-optic probes fabricated from two different crystal orientations of GaAs have been implemented in an electro-optic sampling system that is capable of mapping three independent orthogonal components of free-space electric fields. The results obtained for the radiated field from a microstrip patch antenna by the GaAs probes are compared with results on the same antenna obtained using bismuth silicate and lithium tantalate probes. An 8 m spatial resolution has also been demonstrated for the electro-optic field-mapping system, and the capability for the system to measure field patterns at frequencies up to 100 GHz has been shown.

published proceedings

  • APPLIED PHYSICS LETTERS

altmetric score

  • 3

author list (cited authors)

  • Yang, K., Katehi, L., & Whitaker, J. F.

citation count

  • 49

complete list of authors

  • Yang, K||Katehi, LPB||Whitaker, JF

publication date

  • July 2000