CHARACTERIZATION OF HIGH-FREQUENCY INTERCONNECTS USING FINITE-DIFFERENCE TIME-DOMAIN AND FINITE-ELEMENT METHODS
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IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
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YOOK, J. G., DIB, N. I., & KATEHI, L.
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YOOK, JG||DIB, NI||KATEHI, LPB
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http://dx.doi.org/10.1109/22.310581