Fabrication and accelerated hermeticity testing of an on-wafer package for RF MEMS Academic Article uri icon


  • A hermetic silicon micromachined on-wafer dc-to-40-GHz packaging scheme for RF microelectromechanical systems (MEMS) switches is presented. The designed on-wafer package has a deembedded insertion loss of 0.03 dB per transition up to 40 GHz (a total measured loss of 0.3 dB including a 2.7-mm-long through line) and a return loss below -18dB up to 40 GHz. The hermeticity of the packaged is tested using an autoclave chamber with accelerated conditions of 130/spl deg/C, 2.7 atm of pressure, and 100% relative humidity. The fabrication process is designed so as to be completely compatible with the MEMS switch process, hence, allowing the parallel fabrication of all the components on a single wafer. The on-wafer proposed packaging approach requires no external wiring to achieve signal propagation and, thus, it has the potential for lower loss and better performance at higher frequencies.

published proceedings


altmetric score

  • 3

author list (cited authors)

  • Margomenos, A., & Katehi, L.

citation count

  • 62

complete list of authors

  • Margomenos, A||Katehi, LPB

publication date

  • June 2004