Nonlinear Thermo-Optic Model for the Characterization of Optical Self-Heating in Electro-Optic Semiconductors Academic Article uri icon

abstract

  • A nonlinear thermo-optic model for the characterization of electro-optic semiconductor probes used to simultaneously measure electric field and temperature is presented. Optical thermal self-heating of the semiconductor is shown to be the primary limiting mechanism for temperature dynamic range, electro-optic modulation power, temperature sensitivity, temperature contrast, and temperature invasiveness. Tradeoff considerations of these parameters as a function of optical wavelength and input optical power are discussed. Optical temporal defocusing is shown to minimize the effects of nonlinear absorption. Simulation results are compared with measurements.

published proceedings

  • IEEE Journal of Quantum Electronics

author list (cited authors)

  • Reano, R. M., Whitaker, J. F., & Katehi, L.

citation count

  • 0

complete list of authors

  • Reano, RM||Whitaker, JF||Katehi, LPB

publication date

  • September 2004