MRTD analysis of dielectric cavity structures Conference Paper

abstract

• Multiresolution time domain (MRTD) analysis is applied to model anisotropic dielectric material. In particular, an MRTD scheme based on scaling functions only is used to analyze different types of resonant cavity structures. The results agree very well with those obtained by FDTD, FEM and integral equation methods. MRTD allows for considerable savings in memory and computational time in comparison to FDTD, while maintaining the same accuracy of the results.

name of conference

• 1996 IEEE MTT-S International Microwave Symposium Digest

authors

• Katehi, Linda

published proceedings

• 1996 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3

author list (cited authors)

• Robertson, R., Tentzeris, E., Krumpholz, M., & Katehi, L.

citation count

• 5

complete list of authors

• Robertson, R||Tentzeris, E||Krumpholz, M||Katehi, LPB

publication date

• January 1996

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE MTT-S International Microwave Symposium digest. IEEE MTT-S International Microwave Symposium  Journal

keywords

• Anisotropic Dielectric Material
• Boundary Conditions
• Cavity Resonators
• Dielectric Cavity Structures
• Dielectric Resonators
• Dielectrics
• Equations
• Magnetic Fields
• Magnetic Flux
• Magnetic Materials
• Material Properties
• Multiresolution Time Domain Analysis
• Numerical Analysis
• Resonance
• Resonant Cavity Structures
• Scaling Functions
• Symmetric Matrices
• Tensile Stress
• Time-domain Analysis
• Wavelet Transforms

Digital Object Identifier (DOI)

• 10.1109/mwsym.1996.512309

International Standard Book Number (ISBN) 10

• 0-7803-3247-4

start page

• 1861

end page

• 1864

volume

• 3

URL

• http://dx.doi.org/10.1109/mwsym.1996.512309