MRTD analysis of dielectric cavity structures Conference Paper uri icon


  • Multiresolution time domain (MRTD) analysis is applied to model anisotropic dielectric material. In particular, an MRTD scheme based on scaling functions only is used to analyze different types of resonant cavity structures. The results agree very well with those obtained by FDTD, FEM and integral equation methods. MRTD allows for considerable savings in memory and computational time in comparison to FDTD, while maintaining the same accuracy of the results.

name of conference

  • 1996 IEEE MTT-S International Microwave Symposium Digest

published proceedings

  • 1996 IEEE MTT-S International Microwave Symposium Digest

author list (cited authors)

  • Robertson, R., Tentzeris, E., Krumpholz, M., & Katehi, L.

citation count

  • 6

complete list of authors

  • Robertson, R||Tentzeris, E||Krumpholz, M||Katehi, LPB

publication date

  • January 1996