FDTD characterization of waveguide-probe structures
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abstract
The finite-difference time-domain (FDTD) technique is applied in the calculation of the S-parameters of diode mounting and waveguide-probe structures. The influence of the critical geometrical design parameters on the coupling of the coplanar feedline probe to the waveguide is investigated. A waveguide absorber based on analytic Green's functions is used to minimize the reflections over a wide band of frequencies.