High-resolution electro-optic mapping of near-field distributions in integrated microwave circuits Conference Paper uri icon

abstract

  • A field mapping system based on external electrooptic sampling has been developed in order to determine all components of the electric near-field distribution of guided microwaves with high spatial resolution. The capabilities of the setup are demonstrated by 2D-measurements of normal and tangential fields in a microwave distribution network.

altmetric score

  • 6

author list (cited authors)

  • Yang, K., David, G., Robertson, S., Whitaker, J. F., & Katehi, L.

citation count

  • 6

publication date

  • January 1998

publisher