High-resolution electro-optic mapping of near-field distributions in integrated microwave circuits Conference Paper

abstract

• A field mapping system based on external electrooptic sampling has been developed in order to determine all components of the electric near-field distribution of guided microwaves with high spatial resolution. The capabilities of the setup are demonstrated by 2D-measurements of normal and tangential fields in a microwave distribution network.

name of conference

• 1998 IEEE MTT-S International Microwave Symposium Digest (Cat. No.98CH36192)

authors

• Katehi, Linda

published proceedings

• IEEE MTT-S International Microwave Symposium digest

altmetric score

• 6

author list (cited authors)

• Yang, K., David, G., Robertson, S., Whitaker, J. F., & Katehi, L.

citation count

• 5

complete list of authors

• Yang, K||David, G||Robertson, S||Whitaker, JF||Katehi, LPB

publication date

• January 1998

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE MTT-S International Microwave Symposium digest. IEEE MTT-S International Microwave Symposium  Journal

keywords

• 40 Engineering
• 4008 Electrical Engineering
• 51 Physical Sciences

Digital Object Identifier (DOI)

• 10.1109/mwsym.1998.705148

start page

• 949-952 vol.2

end page

• 952 vol.2

volume

• 2

URL

• http://dx.doi.org/10.1109/mwsym.1998.705148