High-resolution electro-optic mapping of near-field distributions in integrated microwave circuits
- Additional Document Info
- View All
A field mapping system based on external electrooptic sampling has been developed in order to determine all components of the electric near-field distribution of guided microwaves with high spatial resolution. The capabilities of the setup are demonstrated by 2D-measurements of normal and tangential fields in a microwave distribution network.
author list (cited authors)
Yang, K., David, G., Robertson, S., Whitaker, J. F., & Katehi, L.