Electrooptic mapping of near-field distributions in integrated microwave circuits
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A field mapping system based on external electrooptic sampling has been developed in order to determine the vectorial components of the electric near-field distribution within microwave integrated circuits. The capabilities of the setup are demonstrated by two-dimensional measurements of normal and tangential fields in a coplanar microwave distribution network at frequencies up to 15 GHz. Results obtained on a functioning power-distribution network, as well as on two nonfunctioning networks, show the ability of the technique to interrogate internal circuit operation and to isolate faults through investigation of the field distributions.
IEEE Transactions on Microwave Theory and Techniques
author list (cited authors)
Yang, K., David, G., Robertson, S. V., Whitaker, J. F., & Katehi, L.
complete list of authors
Yang, K||David, G||Robertson, SV||Whitaker, JF||Katehi, LPB