Electrooptic mapping of near-field distributions in integrated microwave circuits Academic Article

abstract

• A field mapping system based on external electrooptic sampling has been developed in order to determine the vectorial components of the electric near-field distribution within microwave integrated circuits. The capabilities of the setup are demonstrated by two-dimensional measurements of normal and tangential fields in a coplanar microwave distribution network at frequencies up to 15 GHz. Results obtained on a functioning power-distribution network, as well as on two nonfunctioning networks, show the ability of the technique to interrogate internal circuit operation and to isolate faults through investigation of the field distributions.

published proceedings

• IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES

altmetric score

• 6

author list (cited authors)

• Yang, K., David, G., Robertson, S. V., Whitaker, J. F., & Katehi, L.

citation count

• 57

complete list of authors

• Yang, K||David, G||Robertson, SV||Whitaker, JF||Katehi, LPB

publication date

• January 1998

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE Transactions on Microwave Theory and Techniques  Journal

keywords

• Electric-field Measurement
• Electrooptic Measurements
• Integrated Circuit Testing
• Microwave Measurements
• Nondestructive Testing

Digital Object Identifier (DOI)

• 10.1109/22.739221

start page

• 2338

end page

• 2343

volume

• 46

issue

• 12

URL

• http://dx.doi.org/10.1109/22.739221