Market Power Potential Examination for Electricity Markets Using Perturbation Analysis in Linear Programming OPF Context Conference Paper

name of conference

• Proceedings of the 38th Annual Hawaii International Conference on System Sciences

authors

• Overbye, Thomas

published proceedings

• Proceedings of the 38th Annual Hawaii International Conference on System Sciences

author list (cited authors)

• Sun, Y., & Overbye, T. J.

citation count

• 2

complete list of authors

• Sun, Yan||Overbye, Thomas J

publication date

• January 2005

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

Digital Object Identifier (DOI)

• 10.1109/hicss.2005.402

start page

• 1

end page

• 8

URL

• http://dx.doi.org/10.1109/hicss.2005.402