Error rate in current-controlled logic processors with shot noise Conference Paper uri icon

abstract

  • The error rate in a current-controlled logic processor dominated by shot noise has been investigated. It is shown that the error rate increases very rapidly with increasing cutoff frequency. The maximum clock frequency of the processor, which works without errors, is obtained as a function of the on-state current. The information channel capacity of the system is also studied.

name of conference

  • Noise and Information in Nanoelectronics, Sensors, and Standards II

published proceedings

  • NOISE AND INFORMATION IN NANOELECTRONICS, SENSORS, AND STANDARDS II

author list (cited authors)

  • Kim, J. U., & Kish, L. B.

citation count

  • 0

complete list of authors

  • Kim, JU||Kish, LB

editor list (cited editors)

  • Smulko, J. M., Blanter, Y., Dykman, M. I., & Kish, L. B.

publication date

  • January 2004