Error rate in current-controlled logic processors with shot noise
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The error rate in a current-controlled logic processor dominated by shot noise has been investigated. It is shown that the error rate increases very rapidly with increasing cutoff frequency. The maximum clock frequency of the processor, which works without errors, is obtained as a function of the on-state current. The information channel capacity of the system is also studied.
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Noise and Information in Nanoelectronics, Sensors, and Standards II