INTERFACIAL DEEP LEVELS RESPONSIBLE FOR SCHOTTKY-BARRIER FORMATION AT SEMICONDUCTOR METAL CONTACTS

authors

• Allen, Roland

published proceedings

• APPLICATIONS OF SURFACE SCIENCE

author list (cited authors)

• DOW, J. D., SANKEY, O. F., & ALLEN, R. E.

citation count

• 7

complete list of authors

• DOW, JD||SANKEY, OF||ALLEN, RE

publication date

• May 1985

publisher

• Elsevier  Publisher

published in

• Applications of Surface Science  Journal

Digital Object Identifier (DOI)

• 10.1016/0378-5963(85)90227-2

start page

• 937

end page

• 947

volume

• 22-3

issue

• MAY

URL

• http://dx.doi.org/10.1016/0378-5963(85)90227-2